Modern Op-Amp Distortion Tests: Part 2 — A Few More BJT Types and JFET Devices

Many new op-amp types have appeared in the last decade, and Douglas Self thought it was time to evaluate those for distortion performance. In Part 1 of his article, he measured BJT-input devices using a similar protocol for five different loads and testing for basic op-amp distortion in favorable circumstances. In this second article, the measurement of BJT types is concluded, and he moves the JFET types to the test bench.

Douglas Self has been using a tried-and-true palette of op-amps in his designs. Because many new types have appeared in the last decade, he thought it was high time to evaluate those for distortion performance. In Part 1 of this article, he examines BJT-input devices using a similar protocol for five different loads and testing for basic op-amp distortion in favorable circumstances. FET input op-amps are investigated in Part 2.